On the Very High-Resolution Radar Image Statistics of the Exponentially Correlated Rough Surface: Experimental and Numerical Studies

作者:Jin, M (Jin, Ming)[ 1 ] ; Chen, KS (Chen, Kun-Shan)[ 1 ] ; Xie, DF (Xie, Dengfeng)[ 2 ]

REMOTE SENSING

卷: 10  期: 9

文献号: 1369

DOI: 10.3390/rs10091369

出版年: SEP 2018

摘要

The aim of this study is to investigate, by means of experimental measurements and full-wave simulations, the dominant factors for the very high-resolution (VHR) radar image speckles from exponentially correlated rough surfaces. A Ka-band radar system was used to collect the return signal from such a surface sample fabricated by 3D printing and that signal was further processed into images at different resolution scales, where the image samples were obtained by horizontally turning around the surface sample. To cross-validate the results and to further discuss the VHR speckle properties, full wave simulations by full 3D Finite Difference Time Domain (FDTD) method were conducted with 1600 realizations for the speckle analysis. At the considered very high resolution, speckle statistics show divergence from the fully developed Rayleigh distribution. The factors that impact on the high-resolution speckle properties from exponentially correlated rough surface, are analyzed in views of the equivalent number of scatterers theory and scattering scales, respectively. From the data results and extended discussions, it is evident that both of the above factors matter for VHR speckle of backscattering, from the exponentially correlated rough surface as a good representative for the ground surface.

通讯作者地址: Chen, KS (通讯作者)

Chinese Acad Sci, State Key Lab Remote Sensing Sci, Inst Remote Sensing & Digital Earth, Beijing 100101, Peoples R China.

地址:

[ 1 ] Chinese Acad Sci, State Key Lab Remote Sensing Sci, Inst Remote Sensing & Digital Earth, Beijing 100101, Peoples R China

[ 2 ] Univ Chinese Acad Sci, Beijing 100049, Peoples R China